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"IDDQ test vector selection for transistor short fault testing."
Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita (1997)
- Xiaoqing Wen, Hideo Tamamoto, Kozo Kinoshita:
IDDQ test vector selection for transistor short fault testing. Syst. Comput. Jpn. 28(5): 11-21 (1997)
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