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"Stuck-open faults test generation for cmos combinational circuits."

Seiji Kajihara, Noriyoshi Itazaki, Kozo Kinoshita (1991)

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DOI: 10.1002/SCJ.4690220904

access: closed

type: Journal Article

metadata version: 2023-09-13

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Seiji Kajihara, Noriyoshi Itazaki, Kozo Kinoshita:
Stuck-open faults test generation for cmos combinational circuits. Syst. Comput. Jpn. 22(9): 33-42 (1991)

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