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"vfTLP-VTH: A new method for quantifying the effectiveness of ..."

Yuanzhong Paul Zhou et al. (2013)

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DOI: 10.1016/J.MICROREL.2012.04.011

access: closed

type: Journal Article

metadata version: 2024-05-29

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Yuanzhong Paul Zhou, David Ellis, Jean-Jacques Hajjar, Andrew Olney, Juin J. Liou:
vfTLP-V_TH: A new method for quantifying the effectiveness of ESD protection for the CDM classification test. Microelectron. Reliab. 53(2): 196-204 (2013)

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