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"On the influence of the variation of measurement conditions on the FNT ..."
Jan-Werner Zahlmann-Nowitzki, Lars Nebrich, Peter Seegebrecht (2001)
- Jan-Werner Zahlmann-Nowitzki, Lars Nebrich, Peter Seegebrecht:
On the influence of the variation of measurement conditions on the FNT characteristics of stressed thin silicon oxides. Microelectron. Reliab. 41(7): 1067-1069 (2001)
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