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"Microcontroller susceptibility variations to EFT burst during accelerated ..."

Jianfei Wu et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.099

access: closed

type: Journal Article

metadata version: 2023-12-26

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Jianfei Wu, Chuangwei Li, Binhong Li, Wei Zhu, Hongyi Wang:
Microcontroller susceptibility variations to EFT burst during accelerated aging. Microelectron. Reliab. 64: 210-214 (2016)

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