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"Ultra-high voltage electron microscopy investigation of irradiation ..."

Hajime Sasaki et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.10.005

access: closed

type: Journal Article

metadata version: 2022-10-02

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Hajime Sasaki, Takayuki Hisaka, Kaoru Kadoiwa, Tomoki Oku, Shinobu Onoda, Takeshi Ohshima, Eiji Taguchi, Hidehiro Yasuda:
Ultra-high voltage electron microscopy investigation of irradiation induced displacement defects on AlGaN/GaN HEMTs. Microelectron. Reliab. 81: 312-319 (2018)

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