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"Dynamic defect localization using FPGA to monitor digital values."

Luc Saury, S. Cany (2011)

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DOI: 10.1016/J.MICROREL.2011.06.064

access: closed

type: Journal Article

metadata version: 2020-02-22

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Luc Saury, S. Cany:
Dynamic defect localization using FPGA to monitor digital values. Microelectron. Reliab. 51(9-11): 1701-1704 (2011)

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