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"Comprehensive separate extraction of parasitic resistances in MOSFETs ..."

Junyeap Kim et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.04.011

access: closed

type: Journal Article

metadata version: 2020-06-16

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Junyeap Kim, Hanbin Yoo, Heesung Lee, Seong Kwang Kim, Sungju Choi, Sung-Jin Choi, Dae Hwan Kim, Dong Myong Kim:
Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length. Microelectron. Reliab. 85: 66-70 (2018)

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