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"BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic."

Jacopo Franco et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.058

access: closed

type: Journal Article

metadata version: 2022-02-04

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Jacopo Franco, S. Graziano, Ben Kaczer, Felice Crupi, Lars-Åke Ragnarsson, Tibor Grasser, Guido Groeseneken:
BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic. Microelectron. Reliab. 52(9-10): 1932-1935 (2012)

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