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"Failure modes on low voltage power MOSFETs under high temperature application."

Laurent Dupont et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.066

access: closed

type: Journal Article

metadata version: 2024-01-25

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Laurent Dupont, Stéphane Lefebvre, M. Bouaroudj, Zoubir Khatir, Jean-Claude Faugières:
Failure modes on low voltage power MOSFETs under high temperature application. Microelectron. Reliab. 47(9-11): 1767-1772 (2007)

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