More Web Proxy on the site http://driver.im/

default search action

combined dblp search
author search
venue search
publication search

ask others

"VLSI test through an improved LDA classification algorithm for test cost ..."

Liang Huang, Tai Song (2022)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2022.105461

access: closed

type: Journal Article

metadata version: 2022-12-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/HuangS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/HuangS22
Liang Huang, Tai Song:
VLSI test through an improved LDA classification algorithm for test cost reduction. Microelectron. J. 125: 105461 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.