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"Processor-level reliability simulator for time-dependent gate dielectric ..."

Chang-Chih Chen et al. (2015)

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DOI: 10.1016/J.MICPRO.2015.10.002

access: closed

type: Journal Article

metadata version: 2022-01-03

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Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor:
Processor-level reliability simulator for time-dependent gate dielectric breakdown. Microprocess. Microsystems 39(8): 950-960 (2015)

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