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"Detection of multiple stuck-on/stuck-open faults by single faults test ..."

François Darlay (1991)

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DOI: 10.1016/0165-6074(91)90437-X

access: closed

type: Journal Article

metadata version: 2022-08-17

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François Darlay:
Detection of multiple stuck-on/stuck-open faults by single faults test sets in MOS transistor networks. Microprocessing and Microprogramming 32(1-5): 783-789 (1991)

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