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"Automated Defective Pin Detection for Recycled Microelectronics ..."

Pallabi Ghosh et al. (2019)

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DOI: 10.1007/S41635-019-00069-7

access: closed

type: Journal Article

metadata version: 2023-08-28

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  - https://dblp.org/rec/journals/jhss/GhoshBFC19
Pallabi Ghosh, Aritra Bhattacharya, Domenic Forte, Rajat Subhra Chakraborty:
Automated Defective Pin Detection for Recycled Microelectronics Identification. J. Hardw. Syst. Secur. 3(3): 250-260 (2019)

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