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"Datapath BIST Insertion Using Pre-Characterized Area and Testability Data."
Jiang Chau Wang et al. (2004)
- Jiang Chau Wang, Paulo Sérgio Cardoso, Jose Artur Quilici González, Marius Strum, Ricardo Pires:
Datapath BIST Insertion Using Pre-Characterized Area and Testability Data. J. Electron. Test. 20(4): 333-344 (2004)
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