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"Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit."

Jee-Youl Ryu, Bruce C. Kim (2005)

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DOI: 10.1007/S10836-005-3735-Y

access: closed

type: Journal Article

metadata version: 2020-09-11

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Jee-Youl Ryu, Bruce C. Kim:
Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. J. Electron. Test. 21(6): 571-581 (2005)

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