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"Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits."

Yukiya Miura, Shuichi Seno (2002)

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DOI: 10.1023/A:1014985307989

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yukiya Miura, Shuichi Seno:
Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits. J. Electron. Test. 18(2): 109-120 (2002)

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