More Web Proxy on the site http://driver.im/

default search action

combined dblp search
author search
venue search
publication search

ask others

"Dynamic Power Supply Current Testing of CMOS SRAMs."

Jian Liu, Rafic Z. Makki, Ayman I. Kayssi (2000)

> Home

Details and statistics

DOI: 10.1023/A:1008324900917

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/LiuMK00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/LiuMK00
Jian Liu, Rafic Z. Makki, Ayman I. Kayssi:
Dynamic Power Supply Current Testing of CMOS SRAMs. J. Electron. Test. 16(5): 499-511 (2000)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.