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"The Newsletter of Test Technology Council of the IEEE Computer Society."

Bruce C. Kim (2005)

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DOI: 10.1007/S10836-005-2782-8

access: closed

type: Journal Article

metadata version: 2020-09-11

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Bruce C. Kim:
The Newsletter of Test Technology Council of the IEEE Computer Society. J. Electron. Test. 21(5): 461-462 (2005)

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