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"A Test Platform for Dependability Analysis of SoCs Exposed to EMI and ..."

Juliano Benfica et al. (2012)

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DOI: 10.1007/S10836-012-5334-Z

access: closed

type: Journal Article

metadata version: 2021-10-14

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Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez:
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation. J. Electron. Test. 28(6): 803-816 (2012)

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