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"Test Generation for Crosstalk-Induced Faults: Framework and Computational ..."

Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer (2002)

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DOI: 10.1023/A:1013771821826

access: closed

type: Journal Article

metadata version: 2023-09-21

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Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer:
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results. J. Electron. Test. 18(1): 17-28 (2002)

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