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"Clustered defect detection of high quality chips using self-supervised ..."

Chenn-Jung Huang (2007)

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DOI: 10.1016/J.ESWA.2006.07.011

access: closed

type: Journal Article

metadata version: 2018-11-30

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Chenn-Jung Huang:
Clustered defect detection of high quality chips using self-supervised multilayer perceptron. Expert Syst. Appl. 33(4): 996-1003 (2007)

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