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"Blackbox identity testing for bounded top fanin depth-3 circuits: the ..."

Nitin Saxena, C. Seshadhri (2010)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2022-09-27

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  - electronic edition @ weizmann.ac.il (open access)
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  dblp key:
  - journals/eccc/SaxenaS10a
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  - https://dblp.org/rec/journals/eccc/SaxenaS10a
Nitin Saxena, C. Seshadhri:
Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter. Electron. Colloquium Comput. Complex. TR10 (2010)

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