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"A D&T Roundtable: Deep-Submicron Test in cooperation with the Test ..."

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DOI: —

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type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/X96g
A D&T Roundtable: Deep-Submicron Test in cooperation with the Test Technology Technical Committee. IEEE Des. Test Comput. 13(3): 102-108 (1996)

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