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"Reuse Execution Traces to Reduce Testing of Product Lines."

J. Jenny Li et al. (2007)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2021-01-14

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  dblp key:
  - conf/splc/LiGRW07
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  persistent URL:
  - https://dblp.org/rec/conf/splc/LiGRW07
J. Jenny Li, Birgit Geppert, Frank Rößler, David M. Weiss:
Reuse Execution Traces to Reduce Testing of Product Lines. SPLC (2) 2007: 65-72

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