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"Automated Quality Control for Micro-Technology Components Using a Depth ..."

Daniel Schaper (2002)

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DOI: 10.1109/IAI.2002.999888

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/ssiai/Schaper02
Daniel Schaper:
Automated Quality Control for Micro-Technology Components Using a Depth from Focus Approach. SSIAI 2002: 50-

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