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"Experimental and analytical study of Xeon Phi reliability."

Daniel Oliveira et al. (2017)

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DOI: 10.1145/3126908.3126960

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-08

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  dblp key:
  - conf/sc/OliveiraPDBQKNR17
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  persistent URL:
  - https://dblp.org/rec/conf/sc/OliveiraPDBQKNR17
Daniel Oliveira, Laércio Lima Pilla, Nathan DeBardeleben, Sean Blanchard, Heather Quinn, Israel Koren, Philippe O. A. Navaux, Paolo Rech:
Experimental and analytical study of Xeon Phi reliability. SC 2017: 28

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