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"Towards fully automated testing and characterization for photonic compact ..."

Abdelsalam Aboketaf et al. (2021)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-03

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  - electronic edition @ ieee.org
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  dblp key:
  - conf/ofc/AboketafHDHGPAS21
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  persistent URL:
  - https://dblp.org/rec/conf/ofc/AboketafHDHGPAS21
Abdelsalam Aboketaf, Crystal Hedges, Vishal Dhurgude, Brendan Harris, Fen Guan, Frank Pavlik, Ted Anderson, Andy Stricker, Yusheng Bian, Michal Rakowski, Arunima Dasgupta, Andrea Paganini:
Towards fully automated testing and characterization for photonic compact modeling on 300-mm wafer platform. OFC 2021: 1-3

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