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"Device-Aware Test for Ion Depletion Defects in RRAMs."

Hanzhi Xun et al. (2023)

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DOI: 10.1109/ITC51656.2023.00041

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui:
Device-Aware Test for Ion Depletion Defects in RRAMs. ITC 2023: 246-255

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