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"A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC."

Eiichi Teraoka et al. (1993)

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DOI: 10.1109/TEST.1993.470623

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/TeraokaKYIMWSST93
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  persistent URL:
  - https://dblp.org/rec/conf/itc/TeraokaKYIMWSST93
Eiichi Teraoka, Toru Kengaku, Ikuo Yasui, Kazuyuki Ishikawa, Takahiro Matsuo, Hideyuki Wakada, Narumi Sakashita, Yukihiko Shimazu, Takeshi Tokuda:
A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC. ITC 1993: 791-796

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