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"Constructive Multi-Phase Test Point Insertion for Scan-Based BIST."

Nagesh Tamarapalli, Janusz Rajski (1996)

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DOI: 10.1109/TEST.1996.557122

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/TamarapalliR96
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  - https://dblp.org/rec/conf/itc/TamarapalliR96
Nagesh Tamarapalli, Janusz Rajski:
Constructive Multi-Phase Test Point Insertion for Scan-Based BIST. ITC 1996: 649-658

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