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"probe card-a solution for at-speed, high density, wafer probing."

Rajiv Pandey, Dan Higgins (1998)

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DOI: 10.1109/TEST.1998.743271

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/PandeyH98
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  persistent URL:
  - https://dblp.org/rec/conf/itc/PandeyH98
Rajiv Pandey, Dan Higgins:
probe card-a solution for at-speed, high density, wafer probing. ITC 1998: 836-842

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