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"Multiple path sensitization for hierarchical circuit testing."

Chau-Chin Su, Charles R. Kime (1990)

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DOI: 10.1109/TEST.1990.114013

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/SuK90
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  persistent URL:
  - https://dblp.org/rec/conf/itc/SuK90
Chau-Chin Su, Charles R. Kime:
Multiple path sensitization for hierarchical circuit testing. ITC 1990: 152-161

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