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"On the evaluation of process-fault tolerance ability of CMOS integrated ..."

Etienne Sicard, Kozo Kinoshita (1990)

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DOI: 10.1109/TEST.1990.114115

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/itc/SicardK90
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  persistent URL:
  - https://dblp.org/rec/conf/itc/SicardK90
Etienne Sicard, Kozo Kinoshita:
On the evaluation of process-fault tolerance ability of CMOS integrated circuits. ITC 1990: 948-954

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