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"Interconnect open defect diagnosis with minimal physical information."

Chen Liu et al. (2007)

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DOI: 10.1109/TEST.2007.4437580

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/LiuZRCST07
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  - https://dblp.org/rec/conf/itc/LiuZRCST07
Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang:
Interconnect open defect diagnosis with minimal physical information. ITC 2007: 1-10

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