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"Yield and reliability enhancement for 3D ICs: Dissertation summary: IEEE ..."

Li Jiang, Qiang Xu (2015)

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DOI: 10.1109/TEST.2015.7342423

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Li Jiang, Qiang Xu:
Yield and reliability enhancement for 3D ICs: Dissertation summary: IEEE TTTC E.J. McCluskey doctoral thesis award competition finalist. ITC 2015: 1-11

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