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"The use of tolerance intervals in the characterization of semiconductor ..."

Yolanda T. Hadeed, Kevin T. Lewis (1990)

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DOI: 10.1109/TEST.1990.114136

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/HadeedL90
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  persistent URL:
  - https://dblp.org/rec/conf/itc/HadeedL90
Yolanda T. Hadeed, Kevin T. Lewis:
The use of tolerance intervals in the characterization of semiconductor devices. ITC 1990: 924-928

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