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"Re-Using DFT Logic for Functional and Silicon Debugging Test."

Xinli Gu et al. (2002)

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DOI: 10.1109/TEST.2002.1041816

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/GuWLKC02
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  persistent URL:
  - https://dblp.org/rec/conf/itc/GuWLKC02
Xinli Gu, Weili Wang, Kevin Li, Heon C. Kim, Sung Soo Chung:
Re-Using DFT Logic for Functional and Silicon Debugging Test. ITC 2002: 648-656

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