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"Hybrid Design for Testability Combining Scan and Clock Line Control and ..."

Sanghyeon Baeg, William A. Rogers (1994)

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DOI: 10.1109/TEST.1994.527968

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/BaegR94
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  - https://dblp.org/rec/conf/itc/BaegR94
Sanghyeon Baeg, William A. Rogers:
Hybrid Design for Testability Combining Scan and Clock Line Control and Method for Test Generation. ITC 1994: 340-349

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