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"Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate ..."

Steve Stoffels et al. (2019)

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DOI: 10.1109/IRPS.2019.8720411

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  dblp key:
  - conf/irps/StoffelsPDBTSFZ19
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  - https://dblp.org/rec/conf/irps/StoffelsPDBTSFZ19
Steve Stoffels, Niels Posthuma, Stefaan Decoutere, Benoit Bakeroot, Andrea Natale Tallarico, Enrico Sangiorgi, Claudio Fiegna, J. Zheng, X. Ma, Matteo Borga, Elena Fabris, Matteo Meneghini, Enrico Zanoni, Gaudenzio Meneghesso, Juraj Priesol, Alexander Satka:
Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability. IRPS 2019: 1-10

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