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"Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on ..."

Ryo Akimoto et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128341

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-20

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Ryo Akimoto, Rihito Kuroda, Akinobu Teramoto, Takezo Mawaki, Shinya Ichino, Tomoyuki Suwa, Shigetoshi Sugawa:
Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis of MOSFETs with Various Gate Shapes. IRPS 2020: 1-6

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