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"The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and ..."

Delgermaa Nergui et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529309

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-28

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  - conf/irps/NerguiHMLSLZFC24
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Delgermaa Nergui, Mozhgan Hosseinzadeh, Y. A. Mensah, Harrison P. Lee, D. G. Sam, K. Li, E. X. Zhang, Daniel M. Fleetwood, John D. Cressler:
The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and Ionizing Radiation for 130-nm and 90-nm SiGe HBTs. IRPS 2024: 1-5

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