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"Testable Sequential Circuit Design: Partitioning for Pseudoexhaustive Test."

Bassam Shaer, Kailash Aurangabadkar, Nitin Agarwal (2003)

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DOI: 10.1109/ISVLSI.2003.1183484

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/isvlsi/ShaerAA03
Bassam Shaer, Kailash Aurangabadkar, Nitin Agarwal:
Testable Sequential Circuit Design: Partitioning for Pseudoexhaustive Test. ISVLSI 2003: 244-245

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