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"Test Generation for BiCMOS Circuits."
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya (1993)
- Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Test Generation for BiCMOS Circuits. ISCAS 1993: 1987-1990
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