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"ICC Profile Based Defect Simulation."

Ingeborg Tastl et al. (2006)

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DOI: 10.2352/CIC.2006.14.1.ART00042

access: open

type: Conference or Workshop Paper

metadata version: 2023-07-15

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  dblp key:
  - conf/imaging/TastlKMRB06
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  - https://dblp.org/rec/conf/imaging/TastlKMRB06
Ingeborg Tastl, Kok-Wei Koh, Nathan Moroney, David Rossing, David M. Berfanger:
ICC Profile Based Defect Simulation. CIC 2006: 230-233

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