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"Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node."

Damien Leroy et al. (2008)

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DOI: 10.1109/IOLTS.2008.38

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/iolts/LeroyGSBWW08
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  persistent URL:
  - https://dblp.org/rec/conf/iolts/LeroyGSBWW08
Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong:
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS 2008: 253-257

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