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"From an analytic NBTI device model to reliability assessment of complex ..."

Nasim Pour Aryan et al. (2014)

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DOI: 10.1109/IOLTS.2014.6873666

access: closed

type: Conference or Workshop Paper

metadata version: 2017-07-28

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  dblp key:
  - conf/iolts/AryanLHYGS14
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  - https://dblp.org/rec/conf/iolts/AryanLHYGS14
Nasim Pour Aryan, A. Listl, Leonhard Heiß, Cenk Yilmaz, Georg Georgakos, Doris Schmitt-Landsiedel:
From an analytic NBTI device model to reliability assessment of complex digital circuits. IOLTS 2014: 19-24

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