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"Residual analysis to compare measurement series' differences with ..."

Christian Hatzfeld et al. (2017)

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DOI: 10.1109/ICSENS.2017.8234004

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-15

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  dblp key:
  - conf/ieeesensors/HatzfeldBSAGEK17
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  - https://dblp.org/rec/conf/ieeesensors/HatzfeldBSAGEK17
Christian Hatzfeld, Johannes Bilz, Sascha Schlemmer, Jan-Eric Adolf, Yangyang Gu, Steffen Elgner, Mario Kupnik:
Residual analysis to compare measurement series' differences with significance and size measures. IEEE SENSORS 2017: 1-3

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