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"Active thermal control for reliability improvement of MOS-gated power devices."

Alessandro Soldati et al. (2017)

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DOI: 10.1109/IECON.2017.8217391

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-16

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Alessandro Soldati, Carlo Concari, Fabrizio Dossena, Davide Barater, Francesco Iannuzzo, Frede Blaabjerg:
Active thermal control for reliability improvement of MOS-gated power devices. IECON 2017: 7935-7940

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