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"Convolutional Ensembling based Few-Shot Defect Detection Technique."

Soumyajit Karmakar et al. (2022)

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DOI: 10.1145/3571600.3571607

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-30

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  - conf/icvgip/KarmakarBGS022
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  - https://dblp.org/rec/conf/icvgip/KarmakarBGS022
Soumyajit Karmakar, Abeer Banerjee, Prashant Sadashiv Gidde, Sumeet Saurav, Sanjay Singh:
Convolutional Ensembling based Few-Shot Defect Detection Technique. ICVGIP 2022: 6:1-6:7

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